Invention Grant
US09039911B2 Plasma-enhanced etching in an augmented plasma processing system
有权
增强等离子体处理系统中的等离子体增强蚀刻
- Patent Title: Plasma-enhanced etching in an augmented plasma processing system
- Patent Title (中): 增强等离子体处理系统中的等离子体增强蚀刻
-
Application No.: US13626793Application Date: 2012-09-25
-
Publication No.: US09039911B2Publication Date: 2015-05-26
- Inventor: Eric A. Hudson , Andrew D. Bailey, III , Rajinder Dhindsa
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: B44C1/22
- IPC: B44C1/22 ; H01J37/32 ; H01L21/311

Abstract:
Methods for etching a substrate in a plasma processing chamber having at least a primary plasma generating region and a secondary plasma generating region separated from said primary plasma generating region by a semi-barrier structure. The method includes generating a primary plasma from a primary feed gas in the primary plasma generating region. The method also includes generating a secondary plasma from a secondary feed gas in the secondary plasma generating region to enable at least some species from the secondary plasma to migrate into the primary plasma generating region. The method additionally includes etching the substrate with the primary plasma after the primary plasma has been augmented with migrated species from the secondary plasma.
Public/Granted literature
- US20140054269A1 PLASMA-ENHANCED ETCHING IN AN AUGMENTED PLASMA PROCESSING SYSTEM. Public/Granted day:2014-02-27
Information query