Invention Grant
US09042194B2 Refresh method, refresh address generator, volatile memory device including the same
有权
刷新方法,刷新地址生成器,易失性存储器包括相同的
- Patent Title: Refresh method, refresh address generator, volatile memory device including the same
- Patent Title (中): 刷新方法,刷新地址生成器,易失性存储器包括相同的
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Application No.: US14057556Application Date: 2013-10-18
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Publication No.: US09042194B2Publication Date: 2015-05-26
- Inventor: Chul-Woo Park , Joo-Sun Choi , Hong-Sun Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2012-0116356 20121019
- Main IPC: G11C11/402
- IPC: G11C11/402 ; G11C11/406 ; G11C11/408 ; G11C8/08 ; G11C29/02

Abstract:
A refresh method for a volatile memory device includes refreshing memory cells of a first set of rows of an array at a first refresh rate having a first refresh period, the first refresh rate being a lower rate having a longer refresh period than a second refresh rate having a second refresh period, wherein each memory cell in the first set of rows of the array has a retention time longer than the first refresh period; and refreshing memory cells of a second set of rows of the array at a third refresh rate having a third refresh period, the third refresh rate being a higher rate having a shorter refresh period than the second refresh rate having the second refresh period, wherein at least one memory cell of each row of the second set of rows has a retention time longer than the third refresh period and shorter than the first refresh period. The second refresh period corresponds to a refresh period defined in a standard for the volatile memory device.
Public/Granted literature
- US20140112086A1 REFRESH METHOD, REFRESH ADDRESS GENERATOR, VOLATILE MEMORY DEVICE INCLUDING THE SAME Public/Granted day:2014-04-24
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