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US09046474B2 Multi-analyzer angle spectroscopic ellipsometry 有权
多分析仪角度光谱椭偏仪

Multi-analyzer angle spectroscopic ellipsometry
Abstract:
Ellipsometry systems and ellipsometry data collection methods with improved stabilities are disclosed. In accordance with the present disclosure, multiple predetermined, discrete analyzer angles are utilized to collect ellipsometry data for a single measurement, and data regression is performed based on the ellipsometry data collected at these predetermined, discrete analyzer angles. Utilizing multiple discrete analyzer angles for a single measurement improves the stability of the ellipsometry system.
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