发明授权
- 专利标题: Multi-analyzer angle spectroscopic ellipsometry
- 专利标题(中): 多分析仪角度光谱椭偏仪
-
申请号: US13541176申请日: 2012-07-03
-
公开(公告)号: US09046474B2公开(公告)日: 2015-06-02
- 发明人: Hidong Kwak , Ward Dixon , Leonid Poslavsky , Torsten R. Kaack
- 申请人: Hidong Kwak , Ward Dixon , Leonid Poslavsky , Torsten R. Kaack
- 申请人地址: US CA Milpitas
- 专利权人: KLA-Tencor Corporation
- 当前专利权人: KLA-Tencor Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Suiter Swantz pc llo
- 主分类号: G01J4/00
- IPC分类号: G01J4/00 ; G01N21/21
摘要:
Ellipsometry systems and ellipsometry data collection methods with improved stabilities are disclosed. In accordance with the present disclosure, multiple predetermined, discrete analyzer angles are utilized to collect ellipsometry data for a single measurement, and data regression is performed based on the ellipsometry data collected at these predetermined, discrete analyzer angles. Utilizing multiple discrete analyzer angles for a single measurement improves the stability of the ellipsometry system.
公开/授权文献
- US09007583B2 Multi-analyzer angle spectroscopic ellipsometry 公开/授权日:2015-04-14
信息查询