Invention Grant
- Patent Title: Multi-analyzer angle spectroscopic ellipsometry
- Patent Title (中): 多分析仪角度光谱椭偏仪
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Application No.: US13541176Application Date: 2012-07-03
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Publication No.: US09046474B2Publication Date: 2015-06-02
- Inventor: Hidong Kwak , Ward Dixon , Leonid Poslavsky , Torsten R. Kaack
- Applicant: Hidong Kwak , Ward Dixon , Leonid Poslavsky , Torsten R. Kaack
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/21

Abstract:
Ellipsometry systems and ellipsometry data collection methods with improved stabilities are disclosed. In accordance with the present disclosure, multiple predetermined, discrete analyzer angles are utilized to collect ellipsometry data for a single measurement, and data regression is performed based on the ellipsometry data collected at these predetermined, discrete analyzer angles. Utilizing multiple discrete analyzer angles for a single measurement improves the stability of the ellipsometry system.
Public/Granted literature
- US09007583B2 Multi-analyzer angle spectroscopic ellipsometry Public/Granted day:2015-04-14
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