Invention Grant
US09048095B2 Method for manufacturing a semiconductor device having a channel region in a trench
有权
用于制造在沟槽中具有沟道区的半导体器件的方法
- Patent Title: Method for manufacturing a semiconductor device having a channel region in a trench
- Patent Title (中): 用于制造在沟槽中具有沟道区的半导体器件的方法
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Application No.: US14470996Application Date: 2014-08-28
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Publication No.: US09048095B2Publication Date: 2015-06-02
- Inventor: Anton Mauder , Franz Hirler , Hans Peter Felsl , Hans-Joachim Schulze
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/302 ; H01L29/66 ; H01L29/78 ; H01L29/861 ; H01L29/10 ; H01L29/36 ; H01L29/423 ; H01L29/06

Abstract:
A method of manufacturing a semiconductor device includes forming a semiconductor diode by forming a drift region, forming a first semiconductor region of a first conductivity type in or on the drift region and electrically coupling the first semiconductor region to a first terminal via a first surface of a semiconductor body, etching a trench into the semiconductor body, and forming a channel region of a second conductivity type in the trench and electrically coupling the channel region to the first terminal via the first surface of the semiconductor body. A first side of the channel region adjoins the first semiconductor region.
Public/Granted literature
- US20140370693A1 Method for Manufacturing a Semiconductor Device Having a Channel Region in a Trench Public/Granted day:2014-12-18
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