发明授权
US09084124B2 Methods and apparatus for performing passive antenna testing with active antenna tuning device control
有权
用有源天线调谐装置控制进行无源天线测试的方法和装置
- 专利标题: Methods and apparatus for performing passive antenna testing with active antenna tuning device control
- 专利标题(中): 用有源天线调谐装置控制进行无源天线测试的方法和装置
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申请号: US13725769申请日: 2012-12-21
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公开(公告)号: US09084124B2公开(公告)日: 2015-07-14
- 发明人: Joshua G. Nickel , Jr-Yi Shen , Anand Lakshmanan , Jayesh Nath , Matthew A. Mow , Mattia Pascolini , Vishwanath Venkataraman , Peter Bevelacqua , Xin Cui
- 申请人: Apple Inc.
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Treyz Law Group
- 代理商 Jason Tsai; Joseph F. Guihan
- 主分类号: H04B1/04
- IPC分类号: H04B1/04 ; H04W24/00 ; G01R31/28 ; H04B17/12 ; G01R27/26 ; G01R29/08 ; G01R27/28 ; G01R29/10
摘要:
A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.
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