Invention Grant
- Patent Title: Detector device, inspection apparatus and method
- Patent Title (中): 检测装置,检测装置及方法
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Application No.: US13581427Application Date: 2011-03-11
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Publication No.: US09086361B2Publication Date: 2015-07-21
- Inventor: Arnab Basu , Ian Radley , Max Robinson
- Applicant: Arnab Basu , Ian Radley , Max Robinson
- Applicant Address: GB Sedgefield, Durham
- Assignee: Kromek Limited
- Current Assignee: Kromek Limited
- Current Assignee Address: GB Sedgefield, Durham
- Agency: Drinker Biddle & Reath LLP
- Priority: GB1004121.8 20100312
- International Application: PCT/GB2011/050483 WO 20110311
- International Announcement: WO2011/110862 WO 20110915
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/087

Abstract:
A detector device is described comprising an x-ray detector structure having a detection surface defining at least one separately addressable region for detecting incident x-ray radiation intensity thereon, wherein the separately addressable region is divided into a plurality of sub-regions provided on the detection surface each provided with a filter layer on the detection surface, the filter layers of a given separately addressable region comprising discrete and different materials with discrete defined and spectroscopically spaced x-ray absorption edges. A method of device manufacture, and an apparatus and method for the inspection and characterization of materials employing such a detector device, are also described.
Public/Granted literature
- US20130051521A1 Detector Device, Inspection Apparatus and Method Public/Granted day:2013-02-28
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