Invention Grant
- Patent Title: Dual-port positive level sensitive data retention latch
- Patent Title (中): 双端口正电平敏感数据保持锁存器
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Application No.: US14035250Application Date: 2013-09-24
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Publication No.: US09088271B2Publication Date: 2015-07-21
- Inventor: Steven Bartling , Sudhanshu Khanna
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: H03K3/356
- IPC: H03K3/356 ; H03K3/037

Abstract:
In an embodiment of the invention, a dual-port positive level sensitive data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal (CKT) goes high, (CLKZ) goes low and retention control signal is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit (D2), the clock signals (CKT) and (CLKN), the retain control signals (RET) and the control signals SS (SS) and (SSN). The signals (CKT), (CLKZ), (RET), (SS) and (SSN) determine whether the output of the clocked inverter or the second data bit (D2) is latched in the dual-port latch. Control signal (RET) determines when data is stored in the dual-port latch during retention mode.
Public/Granted literature
- US20150042390A1 DUAL-PORT POSITIVE LEVEL SENSITIVE DATA RETENTION LATCH Public/Granted day:2015-02-12
Information query
IPC分类: