Invention Grant
US09103879B2 Test coverage of integrated circuits with test vector input spreading
有权
测试矢量输入扩展的集成电路测试覆盖
- Patent Title: Test coverage of integrated circuits with test vector input spreading
- Patent Title (中): 测试矢量输入扩展的集成电路测试覆盖
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Application No.: US13778812Application Date: 2013-02-27
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Publication No.: US09103879B2Publication Date: 2015-08-11
- Inventor: Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Jonathan V. Sry; Robert R. Williams
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/3185
Abstract:
An apparatus and method is provided for switching input pins to scan channels to increase test coverage. In one embodiment, a scan system connects a small number of input pins to several scan channels so that the input pins may be selectively switched. The input pins may transmit independent test vectors to test a large number of test areas on a semiconductor chip. The scan system may include a switching device such as a multiplexer (MUX).
Public/Granted literature
- US20140089751A1 TEST COVERAGE OF INTEGRATED CIRCUITS WITH TEST VECTOR INPUT SPREADING Public/Granted day:2014-03-27
Information query
