Invention Grant
- Patent Title: Method of depositing films with narrow-band conductive properties
- Patent Title (中): 沉积窄带导电性能的方法
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Application No.: US13722931Application Date: 2012-12-20
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Publication No.: US09105704B2Publication Date: 2015-08-11
- Inventor: Sergey Barabash , Dipankar Pramanik
- Applicant: Intermolecular, Inc.
- Applicant Address: US CA San Jose
- Assignee: Intermolecular, Inc.
- Current Assignee: Intermolecular, Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: H01L21/3065
- IPC: H01L21/3065 ; H01L29/78 ; H01L21/3105 ; H01L21/28 ; H01L21/768

Abstract:
Conducting materials having narrow impurity conduction bands can reduce the number of high energy excitations, and can be prepared by a sequence of plasma treatments. For example, a dielectric layer can be exposed to a first plasma ambient to form vacancy sites, and the vacancy-formed dielectric layer can be subsequently exposed to a second plasma ambient to fill the vacancy sites with substitutional impurities.
Public/Granted literature
- US20140175567A1 Method of Depositing Films with Narrow-Band Conductive Properties Public/Granted day:2014-06-26
Information query
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