Invention Grant
- Patent Title: Multi-energy ion implantation
- Patent Title (中): 多能离子注入
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Application No.: US14173776Application Date: 2014-02-05
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Publication No.: US09117629B2Publication Date: 2015-08-25
- Inventor: Zhimin Wan
- Applicant: Advanced Ion Beam Technology, Inc.
- Applicant Address: TW Hsin-chu
- Assignee: ADVANCED ION BEAM TECHNOLOGY, INC.
- Current Assignee: ADVANCED ION BEAM TECHNOLOGY, INC.
- Current Assignee Address: TW Hsin-chu
- Agency: Morrison & Foerster LLP
- Main IPC: H01L21/425
- IPC: H01L21/425 ; H01J37/317 ; H01L21/265 ; H01J37/302 ; H01L29/66

Abstract:
In a multi-energy ion implantation process, an ion implanting system having an ion source, an extraction assembly, and an electrode assembly is used to implant ions into a target. An ion beam having a first energy may be generated using the ion source and the extraction assembly. A first voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a second energy, and implant ions into the target at the second energy. A second voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a third energy, and implants ions into the target at the third energy. The third energy may be different from the second energy.
Public/Granted literature
- US20140151573A1 MULTI-ENERGY ION IMPLANTATION Public/Granted day:2014-06-05
Information query
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