Invention Grant
US09123604B2 Image sensor with doped semiconductor region for reducing image noise
有权
具有减少图像噪声的掺杂半导体区域的图像传感器
- Patent Title: Image sensor with doped semiconductor region for reducing image noise
- Patent Title (中): 具有减少图像噪声的掺杂半导体区域的图像传感器
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Application No.: US14056132Application Date: 2013-10-17
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Publication No.: US09123604B2Publication Date: 2015-09-01
- Inventor: Qingfei Chen , Qingwei Shan , Yin Qian , Dyson H. Tai
- Applicant: OmniVision Technologies, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely Sokoloff Taylor & Zafman LLP
- Main IPC: H01L31/12
- IPC: H01L31/12 ; H01L27/12 ; H01L31/06 ; H01L27/146

Abstract:
A backside illuminated image sensor includes a semiconductor layer having a back-side surface and a front-side surface. The semiconductor layer includes a pixel array region including a plurality of photodiodes configured to receive image light through the back-side surface of the semiconductor layer. The semiconductor layer also includes a peripheral circuit region including peripheral circuit elements for operating the plurality of photodiodes that borders the pixel array region. The peripheral circuit elements emit photons. The peripheral circuit region also includes a doped semiconductor region positioned to absorb the photons emitted by the peripheral circuit elements to prevent the plurality of photodiodes from receiving the photons.
Public/Granted literature
- US20150108507A1 IMAGE SENSOR WITH DOPED SEMICONDUCTOR REGION FOR REDUCING IMAGE NOISE Public/Granted day:2015-04-23
Information query
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