Invention Grant
- Patent Title: Method and measuring device for gauging surfaces
- Patent Title (中): 测量表面的方法和测量装置
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Application No.: US12675191Application Date: 2008-08-22
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Publication No.: US09127929B2Publication Date: 2015-09-08
- Inventor: Knut Siercks , Thomas Jensen , Klaus Schneider
- Applicant: Knut Siercks , Thomas Jensen , Klaus Schneider
- Applicant Address: CH Heerbrugg
- Assignee: LEICA GEOSYSTEMS AG
- Current Assignee: LEICA GEOSYSTEMS AG
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Brennan
- Priority: EP07116509 20070914
- International Application: PCT/EP2008/006912 WO 20080822
- International Announcement: WO2009/036861 WO 20090326
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/00

Abstract:
In a method for gauging surfaces (7″), in which a frequency-modulated laser beam is generated, the laser beam is emitted onto the surface as measuring radiation (MS), the measuring radiation (MS) backscattered from the surface (7″) is received and the distance between a reference point and the surface (7″) is measured interferometrically, wherein the measuring radiation (MS) is emitted and received while the surface to be gauged is being scanned, and a measuring arm and a reference interferometer arm with a partially common beam path are used, deviations from the essentially perpendicular impingement of the measuring radiation (MS) on the surface (7″) are taken into account algorithmically during distance measurement and/or are avoided or reduced during scanning by controlling the emission of the measuring radiation (MS).
Public/Granted literature
- US20100312524A1 METHOD AND MEASURING DEVICE FOR GAUGING SURFACES Public/Granted day:2010-12-09
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