Invention Grant
- Patent Title: Method for forming separate narrow lines, method for fabricating memory structure, and product thereof
- Patent Title (中): 形成分离窄线的方法,制造记忆结构的方法及其制品
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Application No.: US14143767Application Date: 2013-12-30
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Publication No.: US09147692B2Publication Date: 2015-09-29
- Inventor: Chin-Cheng Yang
- Applicant: MACRONIX International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX International Co., Ltd.
- Current Assignee: MACRONIX International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L27/115 ; H01L21/768 ; G11C5/06 ; H01L27/02

Abstract:
A method for forming separate narrow lines is described. A target layer is formed over a substrate. Base patterns are formed over the target layer. Target line patterns and connection patterns between the ends of the target line patterns are formed as spacers on the sidewalls of the base patterns. The base patterns are removed. The target line patterns and the connection patterns are transferred to the target layer to form target lines and connection segments between the ends of the target lines. At least a portion of each connection segment is removed to disconnect the target lines while other area of the substrate is subjected to a patterned removal treatment.
Public/Granted literature
- US20150187786A1 METHOD FOR FORMING SEPARATE NARROW LINES, METHOD FOR FABRICATING MEMORY STRUCTURE, AND PRODUCT THEREOF Public/Granted day:2015-07-02
Information query
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