Invention Grant
- Patent Title: Phase change current density control structure
- Patent Title (中): 相变电流密度控制结构
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Application No.: US14481411Application Date: 2014-09-09
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Publication No.: US09147838B2Publication Date: 2015-09-29
- Inventor: Jon Daley , Kristy A. Campbell
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: H01L47/00
- IPC: H01L47/00 ; H01L45/00 ; H01L27/24

Abstract:
A phase change memory element and method of forming the same. The memory element includes first and second electrodes. A first layer of phase change material is between the first and second electrodes. A second layer including a metal-chalcogenide material is also between the first and second electrodes and is one of a phase change material and a conductive material. An insulating layer is between the first and second layers. There is at least one opening in the insulating layer providing contact between the first and second layers.
Public/Granted literature
- US20140374685A1 PHASE CHANGE CURRENT DENSITY CONTROL STRUCTURE Public/Granted day:2014-12-25
Information query
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