发明授权
- 专利标题: Multi-beam scanning electron beam device and methods of using the same
- 专利标题(中): 多光束扫描电子束装置及其使用方法
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申请号: US12528307申请日: 2008-02-22
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公开(公告)号: US09153413B2公开(公告)日: 2015-10-06
- 发明人: Gilad Almogy , Avishai Bartov , Juergen Frosien , Pavel Adamec , Helmut Banzhof
- 申请人: Gilad Almogy , Avishai Bartov , Juergen Frosien , Pavel Adamec , Helmut Banzhof
- 申请人地址: IL Rehovot
- 专利权人: Applied Materials Israel, Ltd.
- 当前专利权人: Applied Materials Israel, Ltd.
- 当前专利权人地址: IL Rehovot
- 代理机构: Patterson & Sheridan, LLP
- 国际申请: PCT/EP2008/001413 WO 20080222
- 国际公布: WO2008/101713 WO 20080828
- 主分类号: G21K7/00
- IPC分类号: G21K7/00 ; H01J37/05 ; H01J37/10 ; H01J37/147 ; H01J37/28
摘要:
A multi-beam scanning electron beam device (100) is described. The multi-bea scanning electron beam device having a column, includes a multi-beam emitter (110) for emitting a plurality of electron beams (12,13,14), at least one common electron beam optical element (130) having a common opening for at least two of the plurality of electron beams and being adapted for commonly influencing at least two of the plurality of electron beams, at least one individual electron beam optical element (140) for individually influencing the plurality of electron beams, a common objective lens assembly (150) for focusing the plurality of electrons beams having a common excitation for focusing at least two of the plurality of electron beams, and adapted for focusing the plurality of electron beams onto a specimen (20) for generation of a plurality of signal beams (121, 131,141), and a detection assembly (170) for individually detecting each signal beam on a corresponding detection element.
公开/授权文献
- US20100320382A1 HIGH THROUGHPUT SEM TOOL 公开/授权日:2010-12-23
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