Invention Grant
- Patent Title: Method and apparatus for drying a wafer
- Patent Title (中): 干燥晶片的方法和装置
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Application No.: US14159647Application Date: 2014-01-21
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Publication No.: US09176387B2Publication Date: 2015-11-03
- Inventor: Wei-Chieh Huang , Hung Chang Hsieh
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G03F7/30
- IPC: G03F7/30 ; H01L21/67 ; B05C11/08 ; B05C13/00 ; B05C9/12 ; B05C11/02

Abstract:
The present disclosure provides a method of fabricating a semiconductor device. The method includes dispensing a liquid on a wafer. The method includes raising the wafer. The method includes lowering the wafer after the raising. The wafer is spun as it is lowered, thereby removing at least a portion of the liquid from the wafer. The present disclosure also provides an apparatus for fabricating a semiconductor device. The apparatus includes a wafer chuck that is operable to hold a semiconductor wafer and secure the wafer thereto. The wafer has a front surface and a back surface. The apparatus includes a dispenser that is operable to dispense a liquid to the front surface of the wafer. The apparatus includes a mechanical structure that is operable to: spin the wafer chuck in a horizontal direction; and move the wafer chuck downwards in a vertical direction while the wafer chuck is being rotated.
Public/Granted literature
- US20140190634A1 Method and Apparatus for Drying a Wafer Public/Granted day:2014-07-10
Information query
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