Invention Grant
- Patent Title: Method of operating memory device
- Patent Title (中): 操作存储设备的方法
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Application No.: US14069588Application Date: 2013-11-01
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Publication No.: US09177660B2Publication Date: 2015-11-03
- Inventor: Hyun-Jun Yoon , Jae-Yong Jeong , Myung-Hoon Choi , Bo-Geun Kim , Ki-Tae Park
- Applicant: Samsung Electronics Co., Ltd
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Ellsworth IP Group PLLC
- Priority: KR10-2012-0123648 20121102
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C16/26 ; G11C16/04 ; G11C29/00

Abstract:
A method of operating a memory device includes changing a first read voltage, which determines a first voltage state or a second voltage state, to a voltage within a first range and determining the voltage as a first select read voltage, and changing a second read voltage, which is used to determine whether the data stored in the memory cells is a third different voltage state or a fourth different voltage state, to a voltage within a second different range and determining the voltage as a second select read voltage. The first voltage state overlaps the second voltage. The third voltage state overlaps the fourth voltage state. A difference between a voltage at an intersection of the third and fourth voltage states and the second read voltage is greater than a difference between a voltage at an intersection of the first and second voltage states and the first read voltage.
Public/Granted literature
- US20140129903A1 METHOD OF OPERATING MEMORY DEVICE Public/Granted day:2014-05-08
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