发明授权
- 专利标题: Manufacturing method of semiconductor device
- 专利标题(中): 半导体器件的制造方法
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申请号: US14324626申请日: 2014-07-07
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公开(公告)号: US09177921B2公开(公告)日: 2015-11-03
- 发明人: Shiro Tan , Kazuhiro Fujimaki , Yu Iwai , Ichiro Koyama , Atsushi Nakamura
- 申请人: FUJIFILM CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2012-046856 20120302; JP2012-134188 20120613
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L23/00 ; H01L21/67 ; H01L21/683
摘要:
A method for manufacturing a semiconductor device with a treated member, includes: subjecting an adhesive support having a substrate and an adhesive layer capable of increasing or decreasing in adhesiveness upon irradiation with an actinic ray, radiation or heat to irradiation of the adhesive layer with an actinic ray, radiation or heat, adhering a first surface of a to-be-treated member to the adhesive layer of the adhesive support, applying a mechanical or chemical treatment to a second surface different from the first surface of the to-be-treated member to obtain a treated member, and detaching a first surface of the treated member from the adhesive layer of the adhesive support, wherein the irradiation of the adhesive layer with an actinic ray, radiation or heat is conducted so that adhesiveness decreases toward an outer surface from an inner surface on the substrate side of the adhesive layer.
公开/授权文献
- US20140322893A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE 公开/授权日:2014-10-30
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