Invention Grant
- Patent Title: System and methods for memory installation in functional test fixture
- Patent Title (中): 功能测试夹具内存安装的系统和方法
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Application No.: US13710376Application Date: 2012-12-10
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Publication No.: US09182444B2Publication Date: 2015-11-10
- Inventor: Hui Peng Jia , Chungfeng Yang , Bin Li
- Applicant: Hui Peng Jia , Chungfeng Yang , Bin Li
- Applicant Address: US TX Round Rock
- Assignee: Dell Products, L.P.
- Current Assignee: Dell Products, L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Haynes and Boone, LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G11C29/56 ; G01R1/04

Abstract:
A system and a method for testing information handling systems is provided. The system includes a top cover having a memory circuit and a bottom platform for receiving a test printed circuit board assembly (PCBA) including a slot. The system includes a sensor determining the relative position of the memory circuit and the slot; and a host controller coupled to the test PCBA and the sensor through a port. A computer program product including a non-transitory computer readable medium having computer readable and executable code is also provided. The code instructs a processor in a host controller in a test fixture to load a memory circuit on a crane; engage a sub-module carrying the memory circuit; load a printed circuit board assembly (PCBA); place a memory device on a slot in the PCBA; perform a system test on the PCBA; disengage the sub-module and the test fixture.
Public/Granted literature
- US20140159757A1 System and Methods for Memory Installation in Functional Test Fixture Public/Granted day:2014-06-12
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