Invention Grant
- Patent Title: Analysis apparatus for high energy particle and analysis method using the same
- Patent Title (中): 高能粒子分析装置及其分析方法
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Application No.: US13873708Application Date: 2013-04-30
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Publication No.: US09182502B2Publication Date: 2015-11-10
- Inventor: Moon Youn Jung , Nam Soo Myung , Dong-Ho Shin , Hwang Woon Lee , Dong Hoon Song , Seunghwan Kim
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2012-0048689 20120508
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01N15/14 ; G01N23/20 ; B82Y15/00

Abstract:
Provided is an analysis apparatus for a high energy particle and an analysis method for a high energy particle. The analysis apparatus for the high energy particle includes a scintillator generating photons with each unique wavelength by the impinging with a plurality of kinds of accelerated high energy particles, a parallel beam converting unit making the photons proceed in parallel to one another, a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength, and a plurality of sensing units arranged on positions where the photons refracted at different angles from the diffraction grating panel reach in a state of being spatially separated, and detecting each of the photons.
Public/Granted literature
- US20130299706A1 ANALYSIS APPARATUS FOR HIGH ENERGY PARTICLE AND ANALYSIS METHOD USING THE SAME Public/Granted day:2013-11-14
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