发明授权
- 专利标题: Mass spectrometer and mass analyzing method
- 专利标题(中): 质谱仪和质量分析方法
-
申请号: US13527627申请日: 2012-06-20
-
公开(公告)号: US09184037B2公开(公告)日: 2015-11-10
- 发明人: Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Hidetoshi Morokuma , Shuhei Hashiba
- 申请人: Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Hidetoshi Morokuma , Shuhei Hashiba
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Baker Botts L.L.P.
- 优先权: JP2011-141388 20110627
- 主分类号: H01J49/00
- IPC分类号: H01J49/00 ; H01J49/04
摘要:
A mass spectrometer including a sample attaching member of attaching a sample, an ionizing chamber including an introductory port of the sample attaching member and an ionization source of generating a sample ion, a vacuumed chamber having a mass analyzer of analyzing the sample ion, and an opening/closing mechanism provided between the ionizing chamber and the vacuumed chamber, in which the opening/closing mechanism is controlled from a closed state to an open state after introducing the sample attaching member into the ionizing chamber to thereby enable to perform ionization with inconsiderable fragmentation at a high sensitivity with a high throughput.
公开/授权文献
- US20120326022A1 MASS SPECTROMETER AND MASS ANALYZING METHOD 公开/授权日:2012-12-27