发明授权
- 专利标题: Electron-beam-pumped light source
- 专利标题(中): 电子束泵浦光源
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申请号: US13884820申请日: 2011-10-11
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公开(公告)号: US09184559B2公开(公告)日: 2015-11-10
- 发明人: Masanori Yamaguchi , Ken Kataoka , Tsuyoshi Maesoba , Hiroyuki Takada , Hiroshige Hata
- 申请人: Masanori Yamaguchi , Ken Kataoka , Tsuyoshi Maesoba , Hiroyuki Takada , Hiroshige Hata
- 申请人地址: JP Tokyo
- 专利权人: Ushio Denki Kabushiki Kaisha
- 当前专利权人: Ushio Denki Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Michael Best & Friedrich LLP
- 优先权: JP2010-251682 20101110; JP2010-251683 20101110; JP2010-251684 20101110
- 国际申请: PCT/JP2011/073292 WO 20111011
- 国际公布: WO2012/063585 WO 20120518
- 主分类号: H01J1/62
- IPC分类号: H01J1/62 ; H01J63/04 ; H01S5/04 ; B82Y20/00 ; H01J63/02 ; H01J63/06 ; H01S5/022 ; H01S5/343
摘要:
The present invention is intended to provide an electron-beam-pumped light source capable of irradiating one surface of a semiconductor light-emitting device uniformly with an electron beam, and capable of obtaining a high light output without increasing an accelerating voltage of the electron beam and, in addition, capable of efficiently cooling the semiconductor light-emitting device. An electron-beam-pumped light source of the present invention includes: an electron beam source and a semiconductor light-emitting device excited by an electron beam emitted from the electron beam source, and characterized in that the electron beam source includes a planar electron beam emitting portion and arranged in the periphery of the semiconductor light-emitting device, and light exits from a surface through which the electron beam from the electron beam source of the semiconductor light-emitting device enters.
公开/授权文献
- US20130322484A1 ELECTRON-BEAM-PUMPED LIGHT SOURCE 公开/授权日:2013-12-05
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