Invention Grant
- Patent Title: Nonvolatile memory device and method of operating the same
- Patent Title (中): 非易失存储器件及其操作方法
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Application No.: US13904047Application Date: 2013-05-29
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Publication No.: US09189174B2Publication Date: 2015-11-17
- Inventor: Han-Jun Lee , Dae-Seok Byeon
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2012-0080648 20120724
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G06F3/06 ; G11C16/30 ; G11C16/12 ; G11C5/14

Abstract:
Provided are a nonvolatile memory device and a method for operating the nonvolatile memory device. The method for operating the nonvolatile memory device includes generating a first program voltage, applying the generated first program voltage to a first word line to which a first memory cell is connected for performing a first program operation on the first memory cell, determining whether a number of pulses of a pumping clock signal for generating the first program voltage is greater than or equal to a predetermined critical value n (where n is a natural number), and stopping the performing of the first program operation on the first memory cell when the number of pulses of the pumping clock signal is determined to be greater than or equal to the predetermined critical value n.
Public/Granted literature
- US20140032821A1 NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME Public/Granted day:2014-01-30
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