Invention Grant
- Patent Title: Topological method to build self-aligned MTJ without a mask
- Patent Title (中): 构建自对准MTJ无掩模的拓扑方法
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Application No.: US14540504Application Date: 2014-11-13
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Publication No.: US09190260B1Publication Date: 2015-11-17
- Inventor: Xunyuan Zhang , Ruilong Xie , Xiuyu Cai , Seowoo Nam , Hyun-Jin Cho
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Ditthavong & Steiner, P.C.
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L21/02 ; H01L27/22

Abstract:
A method of forming a self-aligned MTJ without using a photolithography mask and the resulting device are provided. Embodiments include forming a first electrode over a metal layer, the metal layer recessed in a low-k dielectric layer; forming a MTJ layer over the first electrode; forming a second electrode over the MTJ layer; removing portions of the second electrode, the MTJ layer, and the first electrode down to the low-k dielectric layer; forming a silicon nitride-based layer over the second electrode and the low-k dielectric layer; and planarizing the silicon nitride-based layer down to the second electrode.
Information query
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