Invention Grant
- Patent Title: Sample analysis apparatus
- Patent Title (中): 样品分析仪
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Application No.: US13728329Application Date: 2012-12-27
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Publication No.: US09194879B2Publication Date: 2015-11-24
- Inventor: Hong Geun Kim , Dong Young Kim , Chung Ung Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2011-0143340 20111227
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/00

Abstract:
A sample analysis apparatus is provided with a structure for stopping rotation of a disc at a precise position. The sample analysis apparatus includes a disc configured to rotate on a rotation shaft and having at least one detection zone, an optical sensing apparatus configured to detect a reaction result at the at least one detection zone, at least one position determining protrusion provided on an exterior surface of the disc, a slider movably disposed to in a radial direction relative to the disc, and a stopper mounted to the slider and configured to stop rotation of the disc by blocking the at least one position determining protrusion.
Public/Granted literature
- US20130164175A1 SAMPLE ANALYSIS APPARATUS Public/Granted day:2013-06-27
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