Invention Grant
- Patent Title: Power supply monitor for detecting faults during scan testing
- Patent Title (中): 用于在扫描测试期间检测故障的电源监视器
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Application No.: US13943405Application Date: 2013-07-16
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Publication No.: US09194914B2Publication Date: 2015-11-24
- Inventor: Stephen V. Kosonocky , Grady Giles
- Applicant: Advanced Micro Devices, Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3185

Abstract:
Some embodiments of a power supply monitor include a measurement circuit to measure a voltage provided to the power supply monitor, a comparator to compare the voltage to a predetermined voltage threshold, and an interface to provide, during a scan test of a processing device including the power supply monitor, a fault signal in response to the voltage being below the voltage threshold. Some embodiments of a method include providing a first test pattern to one or more power supply monitors associated with one or more circuit blocks in the processing device and capturing a first result generated by the power supply monitor(s) based on the first test pattern. The first result indicates whether a voltage provided to the circuit block(s) is below a voltage threshold.
Public/Granted literature
- US20150026531A1 POWER SUPPLY MONITOR FOR DETECTING FAULTS DURING SCAN TESTING Public/Granted day:2015-01-22
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