发明授权
- 专利标题: Memory resistor adjustment using feedback control
- 专利标题(中): 使用反馈控制的存储电阻调节
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申请号: US13387307申请日: 2010-02-09
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公开(公告)号: US09196354B2公开(公告)日: 2015-11-24
- 发明人: John Paul Strachan , Julien Borghetti , Matthew D. Pickett , Gilberto Ribeiro , Jianhua Yang
- 申请人: John Paul Strachan , Julien Borghetti , Matthew D. Pickett , Gilberto Ribeiro , Jianhua Yang
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 代理机构: Hewlett-Packard Patent Department
- 国际申请: PCT/US2010/023550 WO 20100209
- 国际公布: WO2011/099961 WO 20110818
- 主分类号: G11C11/56
- IPC分类号: G11C11/56 ; G11C13/00 ; G11C11/54
摘要:
Apparatus and methods related to memory resistors are provided. A feedback controller applies adjustment signals to a memristor. A non-volatile electrical resistance of the memristor is sensed by the feedback controller during the adjustment. The memristor is adjusted to particular values lying between first and second limiting values with minimal overshoot. Increased memristor service life, faster operation, lower power consumption, and higher operational integrity are achieved by the present teachings.
公开/授权文献
- US20120127780A1 MEMORY RESISTOR ADJUSTMENT USING FEEDBACK CONTROL 公开/授权日:2012-05-24
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