Invention Grant
- Patent Title: Methods of forming memory arrays
- Patent Title (中): 形成记忆阵列的方法
-
Application No.: US14265168Application Date: 2014-04-29
-
Publication No.: US09214389B2Publication Date: 2015-12-15
- Inventor: Niccolo′ Righetti , Sara Vigano , Emilio Camerlenghi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L21/768

Abstract:
Some embodiments include methods of forming memory arrays. An assembly is formed which has an upper level over a lower level. The lower level includes circuitry. The upper level includes semiconductor material within a memory array region, and includes insulative material in a region peripheral to the memory array region. First and second trenches are formed to extend into the semiconductor material. The first and second trenches pattern the semiconductor material into a plurality of pedestals. The second trenches extend into the peripheral region. Contact openings are formed within the peripheral region to extend from the second trenches to the first level of circuitry. Conductive material is formed within the second trenches and within the contact openings. The conductive material forms sense/access lines within the second trenches and forms electrical contacts within the contact openings to electrically couple the sense/access lines to the lower level of circuitry.
Public/Granted literature
- US20150311115A1 Methods of Forming Memory Arrays Public/Granted day:2015-10-29
Information query
IPC分类: