Invention Grant
- Patent Title: Two-dimensional scan architecture
- Patent Title (中): 二维扫描架构
-
Application No.: US13416912Application Date: 2012-03-09
-
Publication No.: US09222978B2Publication Date: 2015-12-29
- Inventor: Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
- Applicant: Yu Huang , Wu-Tung Cheng , Ruifeng Guo , Manish Sharma , Liyang Lai
- Applicant Address: US OR Wilsonville
- Assignee: Mentor Graphics Corporation
- Current Assignee: Mentor Graphics Corporation
- Current Assignee Address: US OR Wilsonville
- Agency: Klarquist Sparkman, LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3185

Abstract:
Aspects of the invention relate to techniques of using two-dimensional scan architecture for testing and diagnosis. A two-dimensional scan cell network may be constructed by coupling input for each scan cell to outputs for two or more other scan cells and/or primary inputs through a multiplexer. To test and diagnose the two-dimensional scan cell network, the two-dimensional scan cell network may be loaded with chain patterns and unloaded with corresponding chain test data along two or more sets of scan paths. Based on the chain test data, one or more defective scan cells or defective scan cell candidates may be determined.
Public/Granted literature
- US20120233512A1 Two-Dimensional Scan Architecture Public/Granted day:2012-09-13
Information query