Invention Grant
US09224031B2 Compact dark field light source and dark field image analysis at low magnification 有权
紧凑的暗场光源和低倍率下的暗场图像分析

Compact dark field light source and dark field image analysis at low magnification
Abstract:
The invention relates to image analysis of dark field images obtained at low magnification below 10:1. Image analysis of dark field images obtained at low magnification can be combined with analyzes of images obtained in respect of the same section of a sample and same magnification but with other techniques such as fluorescent microscopy. The system and method can be used e.g. for particle counting, particle size measurement, particle size distribution, morphology measurement, where the particles can be cells and/or cell parts. The invention also relates to a compact dark field light source unit, a system or apparatus including a microscope which by itself is compact and comprises the mentioned dark field light source unit.
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