Invention Grant
- Patent Title: Charge pump calibration for dual-path phase-locked loop
- Patent Title (中): 双路锁相环的电荷泵校准
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Application No.: US14371973Application Date: 2014-01-30
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Publication No.: US09225345B2Publication Date: 2015-12-29
- Inventor: Baoli Tong , Fei Song , Xiaozhi Lin , Xiaofeng Wang
- Applicant: SILICON IMAGE, INC.
- Applicant Address: US OR Portland
- Assignee: Lattice Semiconductor Corporation
- Current Assignee: Lattice Semiconductor Corporation
- Current Assignee Address: US OR Portland
- Agency: Fenwick & West LLP
- International Application: PCT/CN2014/071848 WO 20140130
- International Announcement: WO2015/113308 WO 20150806
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03L7/089 ; H03L7/099

Abstract:
Embodiments of the invention are generally directed to charge pump calibration for a dual-path phase-locked loop circuit. An embodiment of an apparatus includes a phase frequency detector; an integral path including a first charge pump; a proportional path including a second charge pump; and a calibration mechanism for the first charge pump and the second charge pump, the calibration mechanism including a phase detector to detect whether a reference clock signal or a feedback clock signal is leading or lagging in phase and to generate a signal indicating which clock signal is leading or lagging, a first memory element and a second memory element to store the signal from the phase detector, a first control logic to adjust current for the first charge pump based on the value stored in the first memory element, and a second control logic to adjust current for the second charge pump based on the value stored in the second memory element.
Public/Granted literature
- US20150214966A1 Charge Pump Calibration for Dual-Path Phase-Locked Loop Public/Granted day:2015-07-30
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