Invention Grant
- Patent Title: Determination of a material characteristic with the use of second-order photon correlation
- Patent Title (中): 使用二阶光子相关法确定材料特性
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Application No.: US14006463Application Date: 2012-03-22
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Publication No.: US09234840B2Publication Date: 2016-01-12
- Inventor: Mark Brezinski
- Applicant: Mark Brezinski
- Agency: Quarles & Brady LLP
- Agent Yakov Sidorin
- International Application: PCT/US2012/030121 WO 20120322
- International Announcement: WO2012/129404 WO 20120927
- Main IPC: G01N21/43
- IPC: G01N21/43 ; G01N21/45 ; G01N21/49 ; G01N21/84

Abstract:
An optical system and method for characterizing an object is provided. The system includes at least one light source configured to direct photons toward an object and an interferometer configured to receive photons from the object. The system also includes at least one detector system adapted to detect an optical signal at an output of the interferometer and to remove, from the detected optical signal, a signal portion representing first order photon correlations, when present. The system also includes a processor configured to receive data relating to second-order correlated photons from said at least one detector system, each photon or photon pair subject to at least two indistinguishable paths to a photon or photon pair, but differing in at least one of time and length. The processor is configured to characterize the object based on a self interference of the second-order correlated photons from a common location within the object.
Public/Granted literature
- US20140139847A1 DETERMINATION OF A MATERIAL CHARACTERISTICS WITH THE USE OF SECOND-ORDER PHOTON CORRELATIONS Public/Granted day:2014-05-22
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