Invention Grant
US09245638B2 Method of operating a split gate flash memory cell with coupling gate
有权
操作具有耦合栅极的分离栅极闪存单元的方法
- Patent Title: Method of operating a split gate flash memory cell with coupling gate
- Patent Title (中): 操作具有耦合栅极的分离栅极闪存单元的方法
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Application No.: US14216776Application Date: 2014-03-17
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Publication No.: US09245638B2Publication Date: 2016-01-26
- Inventor: Nhan Do , Elizabeth A. Cuevas , Yuri Tkachev , Mandana Tadayoni , Henry A. Om'mani
- Applicant: Silicon Storage Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: Silicon Storage Technology, Inc.
- Current Assignee: Silicon Storage Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: DLA Piper LLP (US)
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26 ; H01L27/115 ; G11C16/14

Abstract:
A method of operating a memory cell that comprises first and second regions spaced apart in a substrate with a channel region therebetween, a floating gate disposed over the channel region and the fir region, a control gate disposed over the channel region and laterally adjacent to the floating gate with a portion disposed over the floating gate, and a coupling gate disposed over the first region and laterally adjacent to the floating gate. A method of erasing the memory cell includes applying a positive voltage to the control gate and a negative voltage to the coupling gate. A method of reading the memory cell includes applying positive voltages to the control gate, to the coupling gate, and to one of the first and second regions.
Public/Granted literature
- US20140198578A1 Method Of Operating A Split Gate Flash Memory Cell With Coupling Gate Public/Granted day:2014-07-17
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