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US09246519B2 Test pattern optimization for LDPC based flawscan 有权
基于LDPC的瑕疵的测试模式优化

Test pattern optimization for LDPC based flawscan
Abstract:
A method for producing a LDPC encoded test pattern for media in a LDPC based drive system includes adding error detection code data to a predominantly zero bit test pattern and adding additional zero bits to produce a test pattern of a desirable length. The test pattern may then be scrambled to produce a desirable flaw detection test pattern. The flaw detection test pattern may then be encoding with an LDPC code, or other error correction code with minimal disturbance to the run length constraints of the data pattern, and written to a storage medium.
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