Invention Grant
- Patent Title: High speed contact detector for measurement sensors
- Patent Title (中): 用于测量传感器的高速接触检测器
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Application No.: US14273980Application Date: 2014-05-09
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Publication No.: US09250055B2Publication Date: 2016-02-02
- Inventor: Matthias Briegel , Edwin Bos , Frank Coenen
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Main IPC: G01B7/012
- IPC: G01B7/012 ; G01B5/012

Abstract:
A workpiece is measured by a contact detector. The contact detector is moved relatively towards a workpiece. A characteristic of the contact detector that changes as the contact detector contacts the workpiece is measured at a plurality of times. A projected time when the characteristic of the contact detector will meet a predetermined threshold is extrapolated from the characteristic measured the plurality of times and using a processor of a computer. A trigger is set to measure coordinates of the workpiece at the projected time. Coordinates of the workpiece are measured at the projected time based on the set trigger.
Public/Granted literature
- US20150323300A1 HIGH SPEED CONTACT DETECTOR FOR MEASUREMENT SENSORS Public/Granted day:2015-11-12
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