公开(公告)号：US09250055B2

公开(公告)日：2016-02-02

申请号：US14273980

申请日：2014-05-09

Applicant: MITUTOYO CORPORATION

Inventor： Matthias Briegel ,  Edwin Bos ,  Frank Coenen

IPC: G01B7/012 ,  G01B5/012

CPC classification number: G01B7/012 ,  G01B5/012 ,  G01B21/047

Abstract: A workpiece is measured by a contact detector. The contact detector is moved relatively towards a workpiece. A characteristic of the contact detector that changes as the contact detector contacts the workpiece is measured at a plurality of times. A projected time when the characteristic of the contact detector will meet a predetermined threshold is extrapolated from the characteristic measured the plurality of times and using a processor of a computer. A trigger is set to measure coordinates of the workpiece at the projected time. Coordinates of the workpiece are measured at the projected time based on the set trigger.

Abstract translation: 工件由接触检测器测量。 接触检测器相对于工件移动。 多次测量接触检测器随着接触检测器接触工件而变化的接触检测器的特性。 当接触检测器的特性达到预定阈值时，从多次测量的特性和使用计算机的处理器进行外推。 设置触发器以在投影时间测量工件的坐标。 基于设置的触发，在投影时间测量工件的坐标。