Invention Grant
- Patent Title: Apparatus and methods to control an electron beam of an X-ray tube
- Patent Title (中): 控制X射线管电子束的装置和方法
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Application No.: US14202520Application Date: 2014-03-10
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Publication No.: US09253864B2Publication Date: 2016-02-02
- Inventor: Antonio Caiafa , Uwe Wiedmann , Philippe Ernest , Georges William Baptiste , Dominique Poincloux , Yan Jiang
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Robert M. McCarthy
- Main IPC: H05G1/50
- IPC: H05G1/50 ; H05G1/30 ; H05G1/52 ; H05G1/58

Abstract:
Apparatus and methods to control an electron beam of an x-ray tube are provided. One apparatus includes at least one of (i) a first switching unit having a voltage source and a pair of switches connected in series and configured to switch between open and closed positions to change an output voltage to engage or bypass the voltage source or (ii) a second switching unit connected to a voltage source and having a first pair of switches connected in series and a second pair of switches connected in series, wherein the first and second pair of switches are connected in parallel, and wherein the first and second pairs of switches are configured to switch between open and closed position to change an output voltage generated from the voltage source. The first and second switching units are connected in series and a third switching unit provided that is amplitude controllable.
Public/Granted literature
- US20150063546A1 APPARATUS AND METHODS TO CONTROL AN ELECTRON BEAM OF AN X-RAY TUBE Public/Granted day:2015-03-05
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