Characterization of an electron beam

    公开(公告)号:US11892576B2

    公开(公告)日:2024-02-06

    申请号:US18155314

    申请日:2023-01-17

    申请人: Excillum AB

    IPC分类号: H01J35/14 H05G1/52 G01T1/34

    摘要: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.

    Influencing a focal spot
    6.
    发明授权

    公开(公告)号:US11457521B2

    公开(公告)日:2022-09-27

    申请号:US17330600

    申请日:2021-05-26

    发明人: Anja Fritzler

    IPC分类号: H05G1/52 H05G1/56 H05G1/30

    摘要: A method is for spatially influencing a focal spot of an X-ray source that generates X-ray radiation, to an associated X-ray source, to an associated system and to an associated computer program product. The method according to at least one embodiment includes: producing a focal spot on an anode by way of an electron emitter including a plurality of emitter segments, individually controllable to emit electrons; determining at least one actual value of a spatial extent and/or of a position of the produced focal spot; comparing the at least one actual value with a specified reference value of the focal spot; and controlling the emitter segments based upon the comparison of the at least one actual value and the reference value such that the at least one actual value converges toward the reference value, thereby spatially influencing the focal spot of the X-ray source that generates X-ray radiation.

    X-ray imaging apparatus and consumption level estimation method for X-ray source

    公开(公告)号:US11450502B2

    公开(公告)日:2022-09-20

    申请号:US17139122

    申请日:2020-12-31

    摘要: An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.

    X-ray radiator
    8.
    发明授权

    公开(公告)号:US11443913B2

    公开(公告)日:2022-09-13

    申请号:US17330978

    申请日:2021-05-26

    发明人: Anja Fritzler

    摘要: An X-ray radiator and an X-ray assembly are disclosed. The X-ray radiator according to an embodiment has an evacuated X-ray tube housing, mounted to be rotatable about a rotation axis, the X-ray tube housing including an anode and an electron source. The anode is arranged within the X-ray tube housing non-rotatably relative to the X-ray tube housing and is configured to generate X-ray radiation via electrons impacting upon a focal spot of the anode, the electron source being mounted substantially stationary within the X-ray tube housing relative to the rotation axis. The electron source has a main emitter and at least one subsidiary emitter for emitting electrons. The electron emission of the main emitter and/or of the at least one subsidiary emitter is controllable such that a spatial movement of the focal spot due to a movement of the electron source is reduced.

    Determining width and height of electron spot

    公开(公告)号:US11257651B2

    公开(公告)日:2022-02-22

    申请号:US16973497

    申请日:2019-06-24

    申请人: Excillum AB

    摘要: A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.