Invention Grant
- Patent Title: Prism-coupling systems and methods for characterizing large depth-of-layer waveguides
- Patent Title (中): 棱镜耦合系统和表征大深度深度波导的方法
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Application No.: US14707431Application Date: 2015-05-08
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Publication No.: US09261429B2Publication Date: 2016-02-16
- Inventor: Shenping Li , Rostislav Vatchev Roussev
- Applicant: Corning Incorporated
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent Timothy M. Schaeberle
- Main IPC: G01B11/16
- IPC: G01B11/16 ; G01M11/00 ; G01L1/24 ; G01B11/22 ; G01J4/04 ; G01N21/41 ; G01N21/84 ; G01N21/23 ; G02B5/04 ; G01J4/00

Abstract:
Prism-coupling systems and methods for characterizing large depth-of-layer waveguides are disclosed. The systems and methods utilize a coupling prism having a coupling angle α having a maximum coupling angle αmax at which total internal reflection occurs. The prism angle α is in the range 0.81αmax≦α≦0.99αmax. This configuration causes the more spaced-apart lower-order mode lines to move closer together and the more tightly spaced higher-order mode lines to separate. The adjusted mode-line spacing allows for proper sampling at the detector of the otherwise tightly spaced mode lines. The mode-line spacings of the detected mode spectra are then corrected via post-processing. The corrected mode spectra are then processed to obtain at least one characteristic of the waveguide.
Public/Granted literature
- US20150338308A1 PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING LARGE DEPTH-OF-LAYER WAVEGUIDES Public/Granted day:2015-11-26
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