Invention Grant
US09263560B2 Power semiconductor device having reduced gate-collector capacitance
有权
具有减小的栅极 - 集电极电容的功率半导体器件
- Patent Title: Power semiconductor device having reduced gate-collector capacitance
- Patent Title (中): 具有减小的栅极 - 集电极电容的功率半导体器件
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Application No.: US14273341Application Date: 2014-05-08
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Publication No.: US09263560B2Publication Date: 2016-02-16
- Inventor: Jae Hoon Park , Jae Kyu Sung , In Hyuk Song , Ji Yeon Oh , Dong Soo Seo
- Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2013-0132494 20131101
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L29/739 ; H01L29/66 ; H01L29/78 ; H01L29/74 ; H01L29/06 ; H01L29/423

Abstract:
A power semiconductor device may include a first conductivity type first semiconductor region; a second conductivity type second semiconductor region formed on an upper portion of the first semiconductor region; a first conductivity type third semiconductor region formed in an upper inner side of the second semiconductor region; a trench gate formed to penetrate through a portion of the first semiconductor region from the third semiconductor region; and a first conductivity type fourth semiconductor region formed below the second semiconductor region while being spaced apart from the trench gate.
Public/Granted literature
- US20150123164A1 POWER SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2015-05-07
Information query
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