发明授权
- 专利标题: Particle beam irradiation system
- 专利标题(中): 粒子束照射系统
-
申请号: US13393418申请日: 2011-03-02
-
公开(公告)号: US09265970B2公开(公告)日: 2016-02-23
- 发明人: Taizo Honda , Masahiro Ikeda
- 申请人: Taizo Honda , Masahiro Ikeda
- 申请人地址: JP Chiyoda-Ku, Tokyo
- 专利权人: MITSUBISHI ELECTRIC CORPORATION
- 当前专利权人: MITSUBISHI ELECTRIC CORPORATION
- 当前专利权人地址: JP Chiyoda-Ku, Tokyo
- 代理机构: Buchanan Ingersoll & Rooney PC
- 国际申请: PCT/JP2011/054768 WO 20110302
- 国际公布: WO2012/117538 WO 20120907
- 主分类号: H01J3/26
- IPC分类号: H01J3/26 ; A61N5/10
摘要:
A particle beam irradiation system comprises deflection electromagnets which scan by deflecting the particle beam in two dimensions in the lateral direction which is perpendicular to an irradiation direction of the particle beam, and an energy width expanding device through which the particle beam passes so as to expand an energy width of the particle beam and form a SOBP in a depth direction of the irradiation target, that is, in an irradiation direction of the particle beam, wherein the energy width expanding device is configured to form the SOBP in the depth direction along whole irradiation area in the depth direction of the irradiation target, and the deflection electromagnets are controlled so as for an irradiation spot which is formed in the irradiation target by the particle beam to move stepwise along whole irradiation area in the lateral direction of the irradiation target.
公开/授权文献
- US20120223247A1 PARTICLE BEAM IRRADIATION SYSTEM 公开/授权日:2012-09-06
信息查询