发明授权
- 专利标题: Semiconductor memory devices including error correction circuits and methods of operating the semiconductor memory devices
- 专利标题(中): 半导体存储器件包括纠错电路和操作半导体存储器件的方法
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申请号: US13910591申请日: 2013-06-05
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公开(公告)号: US09268636B2公开(公告)日: 2016-02-23
- 发明人: Hoi-ju Chung , Su-A Kim , Mu-Jin Seo , Hak-Soo Yu , Jae-Youn Youn , Hyo-Jin Choi
- 申请人: Hoi-ju Chung , Su-A Kim , Mu-Jin Seo , Hak-Soo Yu , Jae-Youn Youn , Hyo-Jin Choi
- 申请人地址: KR Gyeonggi-Do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Gyeonggi-Do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2013-0020674 20130226
- 主分类号: G11C29/00
- IPC分类号: G11C29/00 ; G06F11/10
摘要:
A memory controller includes a controller input/output circuit configured to output a first command to read first data, and output a second command to read an error corrected portion of the first data. A memory device includes: an error detector, a data storage circuit and an error correction circuit. The error detector is configured to detect a number of error bits in data read from a memory cell in response to a first command. The data storage circuit is configured to store the read data if the detected number of error bits is greater than or equal to a first threshold value. The error correction circuit is configured to correct the stored data.
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