Invention Grant
- Patent Title: Isolation of magnetic layers during etch in a magnetoresistive device
- Patent Title (中): 在磁阻器件中蚀刻期间磁层的隔离
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Application No.: US14296153Application Date: 2014-06-04
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Publication No.: US09269894B2Publication Date: 2016-02-23
- Inventor: Chaitanya Mudivarthi , Sarin A. Deshpande , Sanjeev Aggarwal
- Applicant: Everspin Technologies, Inc.
- Applicant Address: US AZ Chandler
- Assignee: Everspin Technologies, Inc.
- Current Assignee: Everspin Technologies, Inc.
- Current Assignee Address: US AZ Chandler
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L43/08 ; H01L27/22

Abstract:
Isolation of magnetic layers in the magnetoresistive stack is achieved by passivation of sidewalls of the magnetic layers or deposition of a thin film of non-magnetic dielectric material on the sidewalls prior to subsequent etching steps. Etching the magnetic layers using a non-reactive gas further prevents degradation of the sidewalls.
Public/Granted literature
- US20150102006A1 ISOLATION OF MAGNETIC LAYERS DURING ETCH IN A MAGNETORESISTIVE DEVICE Public/Granted day:2015-04-16
Information query
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