Invention Grant
- Patent Title: Frequency detection circuits, radio frequency signal processing devices and methods for calibrating inductance and capacitance
- Patent Title (中): 频率检测电路,射频信号处理装置和校准电感和电容的方法
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Application No.: US14017391Application Date: 2013-09-04
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Publication No.: US09274200B2Publication Date: 2016-03-01
- Inventor: Hsien-Ku Chen , Bing-Jye Kuo , Fang-Ren Liao , Pei-Wei Chen
- Applicant: VIA Telecom, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schiff Hardin LLP
- Priority: CN201210512819 20121204
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R31/02 ; G01R31/06 ; G01R31/28

Abstract:
A frequency detection circuit includes a filter, a power detector and a voltage comparator. The filter receives and filters a converted signal to generate a filtered signal. The power of the filtered signal relates to a frequency of the converted signal. The power detector generates a voltage according to the power of the filtered signal. The voltage comparator compares the voltage with multiple reference voltages to generate multiple comparison results. At least one of the inductance and capacitance of an LC tank in an amplifier is adjusted according to the comparison results.
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