Invention Grant
- Patent Title: Nonvolatile memory device and program method
- Patent Title (中): 非易失性存储器件和程序方法
-
Application No.: US14476123Application Date: 2014-09-03
-
Publication No.: US09275751B2Publication Date: 2016-03-01
- Inventor: Wookghee Hahn , Doohyun Kim , Changyeon Yu
- Applicant: Wookghee Hahn , Doohyun Kim , Changyeon Yu
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2013-0110646 20130913
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56 ; G11C16/04

Abstract:
A programming method includes a first program loop applying first and second pulses to a selected word line and thereafter determining a threshold voltage for the selected memory cell in relation to first and second verification voltages. Then, upon determining that the threshold voltage is lower than the first verification voltage, performing the second program loop by applying the first pulse to the selected word line, or upon determining that the threshold voltage is higher than the first verification voltage and lower than the second verification voltage, performing the second program loop by applying the second pulse to the selected word line.
Public/Granted literature
- US20150078093A1 NONVOLATILE MEMORY DEVICE AND PROGRAM METHOD Public/Granted day:2015-03-19
Information query