Invention Grant
US09276574B2 Scan flip-flop circuits and scan test circuits including the same
有权
扫描触发器电路和扫描测试电路,包括它们
- Patent Title: Scan flip-flop circuits and scan test circuits including the same
- Patent Title (中): 扫描触发器电路和扫描测试电路,包括它们
-
Application No.: US13890517Application Date: 2013-05-09
-
Publication No.: US09276574B2Publication Date: 2016-03-01
- Inventor: Hoi-jin Lee , Bai-Sun Kong
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2010-0055006 20100610
- Main IPC: H03K19/003
- IPC: H03K19/003 ; H03K3/356

Abstract:
A scan flip-flop circuit includes an input unit and an output unit. The data output unit is configured to provide a data output terminal with a data output signal in response to a data input signal and a first control signal in a first operation mode, and the data output unit is configured to prohibit the data output terminal from being provided with a power supply voltage and a ground voltage applied to the scan flip-flop circuit in response to the data input signal and the first control signal in a second operation mode. The scan output unit is configured to provide a scan output terminal with a scan output signal in response to a scan input signal and a second control signal in the second operation mode.
Public/Granted literature
- US20130241594A1 SCAN FLIP-FLOP CIRCUITS AND SCAN TEST CIRCUITS INCLUDING THE SAME Public/Granted day:2013-09-19
Information query