Scan flip-flop circuits and scan test circuits including the same
    1.
    发明授权
    Scan flip-flop circuits and scan test circuits including the same 有权
    扫描触发器电路和扫描测试电路,包括它们

    公开(公告)号:US09276574B2

    公开(公告)日:2016-03-01

    申请号:US13890517

    申请日:2013-05-09

    CPC classification number: H03K19/003 H03K3/356182

    Abstract: A scan flip-flop circuit includes an input unit and an output unit. The data output unit is configured to provide a data output terminal with a data output signal in response to a data input signal and a first control signal in a first operation mode, and the data output unit is configured to prohibit the data output terminal from being provided with a power supply voltage and a ground voltage applied to the scan flip-flop circuit in response to the data input signal and the first control signal in a second operation mode. The scan output unit is configured to provide a scan output terminal with a scan output signal in response to a scan input signal and a second control signal in the second operation mode.

    Abstract translation: 扫描触发器电路包括输入单元和输出单元。 数据输出单元被配置为在第一操作模式中响应于数据输入信号和第一控制信号向数据输出端提供数据输出信号,并且数据输出单元被配置为禁止数据输出端 在第二操作模式中响应于数据输入信号和第一控制信号,提供施加到扫描触发器电路的电源电压和接地电压。 扫描输出单元被配置为在第二操作模式中响应于扫描输入信号和第二控制信号向扫描输出端提供扫描输出信号。

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