Disclosed herein is an apparatus for testing switching of a power semiconductor module, including: a power semiconductor module including a plurality of power semiconductor devices corresponding to a plurality of phases to test a switching operation of a corresponding power semiconductor device; a power supply unit supplying power to the power semiconductor module; a relay switching unit including a plurality of relay switch devices that connects or disconnects between the power semiconductor module and the power supply unit according to a relay control signal; and a control unit controlling the relay switching unit to test on/off characteristics of at least one of the plurality of power semiconductor devices individually or simultaneously, By this configuration, the on/off operations of the plurality of power semiconductor devices are tested individually or simultaneously by the control of the plurality of relay switch devices, thereby improving the user convenience and reducing the test time.