Described are apparatuses and methods for improving resistive memory energy efficiency and reliability. An apparatus may include a resistive memory cell coupled to a conductive line. The apparatus may further include a driver coupled to the conductive line to drive current for the resistive memory cell during a write operation. The resistance of the driver may be selectively increased for two or more time periods during the write operation for detecting a voltage change on the conductive line. The current for the write operation may be turned off when the voltage change is detected to improve resistive memory energy efficiency and reliability.