Invention Grant
- Patent Title: Probe unit
- Patent Title (中): 探头单元
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Application No.: US14349410Application Date: 2012-10-04
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Publication No.: US09291645B2Publication Date: 2016-03-22
- Inventor: Akihiro Matsui , Takashi Mori
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama-shi
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama-shi
- Agency: Locke Lord LLP
- Priority: JP2011-223359 20111007
- International Application: PCT/JP2012/075862 WO 20121004
- International Announcement: WO2013/051675 WO 20130411
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R31/28 ; G01R1/067 ; G09G3/00

Abstract:
A probe unit includes: contact probes; and a probe holder, each of the contact probe including a plunger and a spring coil, each of the plunger including: a contact portion contacting an electrode of a contacted body; a flange portion extending from a base end of the contact portion and having a diameter larger than a diameter of the contact portion; a boss portion extending from an end of the flange portion different from an end continuing to the contact portion and having a diameter smaller than the diameter of the flange portion; and a base end portion extending from an end of the boss portion different from an end continuing to the flange portion and having a substantially same diameter with the boss portion.
Public/Granted literature
- US20150285840A1 PROBE UNIT Public/Granted day:2015-10-08
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